ISSN 1011-6559 (from 1982 to 2018) | ISSN 2707-6806 (print) ISSN 2707-6792 (online)
Abbreviated key-title: Optoelektron. napìvprovìd. teh.
https://doi.org/10.15407/jopt / https://doi.org/10.15407/iopt
Journal Optoelectronic and Semiconductor Technique is registered by the National Council of Ukraine on Television and Radio Broadcasting #997 by 28.03.2024
Media ID- R30-03457
Журнал «Оптоелектроніка та напівпровідникова техніка» зареєстрований Національною радою України з питань телебачення і радіомовлення №997 від 28.03.2024. Ідентифікатор медіа - R30-03457
PEER REVIEW
The articles are reviewed by two independent experts who are appointed by the editorial board (single blind reviewing process), more information at Publication Ethics. After that the corresponding author receives a copy of an article manuscript with reviewers remarks. Reprint version revised by the author and agreed with reviewers is considered the final one and must be signed by the reviewers and authors. After that the text, figures and tables replacements or modifications are prohibited. When ublishing an article the editorial board follows the last version delivery date.
Authors are welcome to suggest suitable independent reviewers when they submit their manuscripts, but these suggestions may not be followed by the journal. Authors may also request the journal to exclude not more than two individuals or laboratories. The journal sympathetically considers such exclusion requests and usually honors them, but the editor's decision on the choice of peer-reviewers is final. Ourjournal editors treat the submitted manuscript and all communication with authors and referees as confidential. Authors must also treat communication with the journal as confidential: correspondence with the journal, reviewers' reports and other confidential material must not be posted on any website or otherwise publicized without prior permission from the editors, whether or not the submission is eventually published.
Check for PLAGIARISM
The papers are routinely scanned for plagiarism using installed plagiarism checker http://www.antiplagiarism.net , and free online plagiarism checker tools http://smallseotools.com/plagiarism-checker.
The Editorial Office of the journal is located at V. Lashkaryov Institute of Semiconductor Physics of National Academy of Sciences of Ukraine. Address: 41 Nauky prospekt, Kyiv 03680, Ukraine. Tel: (+38 044) 525 6373; 525 6205 http://isp.kiev.ua/
The Publisher is V. Lashkaryov Institute of Semiconductor Physics of National Academy of Sciences of Ukraine
