1. Rogalskij A. Infrakrasnye detektory. Novosibirsk: Nauka, 2003. (in Russian)
2. Kies R.Dzh., Kruze P.V., Patli E.G. i dr. Fotopriemniki vidimogo i IK diapazonov. M.: Radio i svyaz, 1985. (in Russian)
3. Gossorg Zh. Infrakrasnaya termografiya. Osnovy, tehnika, primenenie. M.: Mir, 1988. (in Russian)
4. Aksenenko M.D., Baranochnikov M.L. Priemniki opticheskogo izlucheniya. Spravochnik. M.: Radio i svyaz, 1987. (in Russian)
5. Tetyorkin V.V., Sukach A.V., Tkachuk A.A. Infrared Photodiodes on II - VI and III-V Narrow Gap Semiconductors. In: Photodiodes - from fundamentals to applications. Ed. Prof. Ilgu Yun. Vienna: In Techopen, 2012. P. 403 - 426.
https://doi.org/10.5772/52930
6. Sukach A.V., Tetorkin V.V., Matiyuk I.M., Tkachuk A.I. InAs fotodiodi (Oglyad). OPT. Kiev: Nauk. dumka, 2015. Vyp. 50. S. 17 - 43. (in Ukrainian)
7. Sukach A.V., Tetorkin V.V., Matiyuk I.M., Tkachuk A.I. InSb fotodiodi (Oglyad. Chastina I). OPT. Kiev: Nauk. dumka, 2016. Vyp. 51. S. 43 - 68. (in Ukrainian)
https://doi.org/10.15407/jopt.2016.51.043
8. Sukach A.V., Tetorkin V.V., Matiyuk I.M., Tkachuk A.I. InSb fotodiodi (Oglyad. Chastina II). OPT. Kiev: Nauk. dumka, 2016. Vyp. 51. S. 69 - 90. (in Ukrainian)
https://doi.org/10.15407/jopt.2016.51.069
9. Miroshnikov M.M. Teoreticheskie osnovy optiko-elektronnyh priborov. Leningrad: Mashinostroenie, 1977. (in Russian)
10. Indium Antimonide Detectors. Catalog Teledyne Judson Technologies. 2018. P. 12 - 15.
11. Sukach A.V., Tetorkin V.V., Matiyuk I.M., Tkachuk A.I., Trocenko S.P. InSb fotodiodi. (Oglyad. Chastina III). OPT. Kiev: Nauk. dumka, 2017. Vyp. 52. S. 5 - 36. (in Ukrainian)
https://doi.org/10.15407/jopt.2017.52.005
12. Sukach A.V., Tetorkin V.V., Matiyuk I.M., Tkachuk A.I., Trocenko S.P. InSb fotodiodi (Oglyad. Chastina IV). OPT. Kiev: Nauk. dumka, 2018. Vyp. 53. S. 17 - 38. (in Ukrainian)
13. Hall D.N., Aikens R.S., Jouse R. et al. Johnson noise limited operation of photovoltaic InSb detectors. Appl. Opt. 1975. 14, N 2. P. 450 - 453.
https://doi.org/10.1364/AO.14.000450
14. Astahov V.P., Gindin P.D., Karpov V.V. i dr. Rezultaty razrabotki fotodiodov na InSb s ultranizkimi temnovymi tokami dlya vysokochuvstvitelnyh PZS. Prikladnaya fizika. 1999. № 2.
S. 73 -79. (in Russian)
15. Gerasimenko N.N., Guzev A.A., Kuryshev G.L. i dr. Primenenie metodov ionnogo legirovaniya dlya sozdaniya p-n-perehodov na InSb i InAs. Preprint 2. Institut fiziki poluprovodnikov SO AN SSSR. Novosibirsk: Institut fiziki poluprovodnikov SO AN SSSR, 1991. (in Russian)
16. Blom I. and Nemirovsky Y. Surface passivation backside-illuminated indium antimonide focal plane array. IEEE Trans. Electron. Devices. 1993. 40, N 2. P. 303 - 313.
https://doi.org/10.1109/16.182506
17. Miroshnikova I.N., Gulyaev A.M., Nedoruba D.A. Primenenie shumovoj spektroskopii dlya prognozirovaniya nadezhnosti priemnikov IK-izlucheniya na osnove antimonida indiya. Priklad. fiz. 2003. № 6. S. 92 - 97. (in Russian)
18. Astahov V.P., Karpov V.V., Krapuhin V.V. i dr. Fotodiody iz antimonida indiya s effektom Mossa - Burshtejna na osnove zhidkofaznyh struktur. Priklad. fiz. 2012. № 4. S. 79 - 82. (in Russian)
19. Burlakov I.D., Boltar K.D., Vlasov P.V. i dr. Fotoelektricheskie harakteristiki MFPU na osnove epitaksialnyh sloev antimonida indiya na vysokolegirovannoj podlozhke. Priklad. fiz. 2016. №3. S. 58 - 64. (in Russian)
20. Luft B.D., Perevoshikov V.A., Vozmilova L.N. i dr. Fiziko-himicheskie metody obrabotki poverhnosti poluprovodnikov. M.: Radiosvyaz, 1982. (in Russian)
21. Perevoshikov V.A., Skupov V.D. Osobennosti abrazivnoj i himicheskoj obrabotki poverhnosti poluprovodnikov. Nizhnij Novgorod: NNGU, 1992. (in Russian)
22. Danilenko S.G. Rozrobka travilnih kompozicij ta tehnologichnih procesiv formuvannya polirovanih poverhon pidkladok arsenidu ta antimonidu indiyu dlya priladiv ICh-tehniki: avtoref. dis. kand. tehn. nauk. Kiyiv, 2000. 15 s. (in Ukrainian)
23. Kiseleva L.V., Lopuhin A.A., Mezin Yu.S. i dr. Vliyanie rezhimov himicheskoj obrabotki monokristallov InSb na sostav i strukturu poverhnosti. Priklad. fiz. 2015. №5. S. 84 - 89. (in Russian)
24. Lopuhin A.A. Vliyanie tolshiny fotochuvstvitelnyh sloev na svojstva MFPU na osnove antimonida indiya. Priklad. fiz. 2014. №6. S. 66 - 69. (in Russian)
25. Boltar K.D., Vlasov P.V., Eroshenkov V.V., Lopuhin A.A. Issledovanie fotodiodov s tokami utechki v matrichnyh fotopriemnikah na osnove antimonida indiya. Priklad. fiz. 2014. №4. S. 45 - 50. (in Russian)
26. Grishina A.N., Vlasov P.V., Eroshenkov V.V., Lopuhin A.A. Vliyanie parametrov mezastruktury na defektnost matrichnyh fotopriemnyh ustrojstv na osnove antimonida indiya. Priklad. fiz. 2017. №1. S. 26 - 30. (in Russian)
27. Sukach A.V., Tetorkin V.V., Tkachuk A.I., Trocenko S.P. InSb fotodiodi (Oglyad. Chastina III) OPT. Kiyiv: Nauk. dumka, 2017. Vyp. 52. S. 140 - 149. (in Ukrainian)
https://doi.org/10.15407/jopt.2017.52.005
28. Goltvyanskij Yu.V., Gudimenko O.J., Dubikovskij O.V. ta in. Doslidzhennya procesiv formuvannya fotodiodiv v InSb pri ionnij implantaciyi beriliyu. OPT. Kiyiv: Nauk. dumka, 2017. Vyp. 52. C. 141 - 150. (in Ukrainian)
29. Shabrin A.D., Goncharov A.E., Pashkeev D.A. Analiz razorientacii monokristallicheskih blokov obemnogo kristalla InSb. Priklad. fiz. 2017. №3. S. 101 - 106. (in Russian)
30. Sun Tai-Ping, Lee Si-Chen, Yang Cheng-Jeen. The current leakage mechanism in InSb p+-n-diodes. J. Apll. Phys. 1990. 67, No. 11. P. 7092 - 7097.
https://doi.org/10.1063/1.345059
31. Kuryshev G.L., Myasnikov A.M., Obodnikov V.I. i dr. Pereraspredelenie berilliya v InSb i InAs pri vnedrenii ionov i posleduyushem otzhige. FTP. 1994. 28, №3. S. 439 - 442. (in Russian)
32. Kolcov G.I., Makarov V.V., Yurchuk S.Yu. Profili implantirovannogo berilliya v poluprovodnikovyh soedineniyah AIIBV. FTP. 1996. 39, №10. S 1907 - 1916. (in Russian)
33. Jialu Liu, Tinging Zhang. Rapid thermal annealing characteristics of Be implanted into InSb. Appl. Surf. Sci. 1998. 126, No. 2. P. 231 - 234.
https://doi.org/10.1016/S0169-4332(97)00695-8
34. Trohin A.S., Skakun N.A., Stoyanova I.G. i dr. Lokalizaciya atomov berilliya v kristallicheskoj reshetke antimonida indiya pri ionnoj implantacii. Poverhnost. Fizika, himiya, mehanika. 1988. №8. S. 144 - 146. (in Russian)
35. Sukach A.V., Tetyorkin V.V. and Tkachuk A.I. Electrical properties of InSb p-n junctions prepared by diffusion method. Carrier transport mechanisms in reverse biased InSb p-n functions. SPQEO. 2016. 19, No 3. P. 295 - 298.
https://doi.org/10.15407/spqeo19.03.295
36. Madelung O. Fizika poluprovodnikovyh soedinenij elementov III i V grupp. M.: Mir, 1967. 466 s. (in Russian)
37. Wimmers J.T., Davis R.M., Niblack C.A. and Smith D.S. Indium antimonide detector technology of Cincinati Electronics Corporation. Proc. SPIE. 1988. 930. P. 125 - 138.
https://doi.org/10.1117/12.946633
38. Nishitani K., Nagahama K. and Mutorani T. Extremally reproducible zinc diffusion into InSb and its applications to infrared array. J. Electron. Mater. 1983. 12, No. 1. P. 125 - 141.
https://doi.org/10.1007/BF02651639
39. Simchi H., Bagreani Sh. and Saani M.H. Cleaning InSb wafers for manufacturing InSb detectors. Eur. Phys. J. Appl. Phys. 2006. 33, No. 1. P. 1 - 4.
https://doi.org/10.1051/epjap:2006001
40. Boltaks B.I., Sokolov V.I. Issledovanie diffuzii kadmiya v antimonide indiya metodom poslojnoj avtoradiografii. FTT. 1963. 5, №4. S. 1077 - 1081. (in Russian)
41. Gusev I.A., Murin A.N., Seregin P.P. O diffuzii kadmiya v antimonide indiya. FTT. 1964. 6, №6. S. 1895 - 1896. (in Russian)
42. Catagnus P.C., Polansky C. and Spratt J.P. Diffusion of cadmium into InSb. Solid-State Electron. 1973. 16, No. 4. P. 633 - 635.
https://doi.org/10.1016/0038-1101(73)90164-0
43. Abdullaev G.B., Dzhafarov T.D. Atomnaya diffuziya v poluprovodnikovyh strukturah. M.: Atomizdat, 1980. 280 s. (in Russian)
44. Boltaks B.I. Diffuziya v poluprovodnikah. M.: Fizmatgiz, 1961. 482 s. (in Russian)
45. Atomnaya diffuziya v poluprovodnikah. Pod red. D. Shou. M.: Mir, 1975. 684 s. (in Russian)
46. Shtabnova V.L., Kirovskaya I.A. Himicheskij sostav poverhnosti soedinenij InBV. Izv. AN SSSR. Neorgan. mater. 1989. 25, №2. S. 207 - 211. (in Russian)
47. Brilliantov A.I., Korotkov A.V., Novotockij-Vlasov Yu.F. Effekt polya na poverhnostyah (111) i (111) p-InSb. Elektronnaya tehnika. Ser. Materialy. 1969. №6. S. 61 - 64. (in Russian)
48. Astahov V.P., Gindin P.D., Karpov V.V., Talimov A.V. Povyshenie termostojkosti fotodiodov na InSb. Priklad. fiz. 2002. №1. S 56 - 62. (in Russian)
49. Korwin-Pawlowski M.I., Heassel E.L. Characteristics MOS capacitors formed on p-type InSb. Phys. Status Solidi (a). 1974. 24, N 3. P. 649 - 652.
https://doi.org/10.1002/pssa.2210240233
50. Langan J.D., Wiswanatham C.R. Characterisation of improved InSb interfaces. J. Vac. Sei.Technol. 1979. 16, N 5. P. 1474 - 1477.
https://doi.org/10.1116/1.570225
51. Hang R.Y., Yon E.T. Surface study of anolised indium antimonide. J. Appl. Phys. 1970. 41, N 5. P. 2185 - 2189.
https://doi.org/10.1063/1.1659187
52. Beketov G.V., Sukach A.V., Tetyorkin V.V., Trotsenko S.P. Trap-assisted conductivity in anodic oxide on InSb. SPQEO. 2017. 20, No 4. P. 470 - 474.
https://doi.org/10.15407/spqeo20.04.470
53. 53.Lebedev M.V., Shimomura M., Fukuda Y. Rekonstrukciya poverhnosti InSb(111)A pri adsorbcii sery. FTP. 2007. 41, № 5. S. 539 - 543. (in Russian)
https://doi.org/10.1134/S1063782607050077
54. 54. Park S.H., Song T.Y., Kim H.S. at al. Optimization the fabrication process of InSb Schottky diodes. J. Korean Phys. Soc. 2008. 53, № 4. P. 1854 - 1858.
https://doi.org/10.3938/jkps.53.1854
55. Kompanichenko N.M., Omelchuk A.A., Kozin V.F. Vzaimodejstvie arsenida indiya i antimonida galliya s seroj. Neorg. mater. 2003. 39, № 3. S. 276 - 281. (in Russian)
https://doi.org/10.1023/A:1022657020529
56. Simchi H., Sareminia Gh., Shafiekhani A. at al. Passivation of InSb surface for manufacturing infrared devices. Infrared Physics & Technology. 2008. 51, № 2. P. 263 - 269.
https://doi.org/10.1016/j.infrared.2007.09.001
57. Odendaal V., Botha J.R. and Aurent F.D. On the processing of InAs and InSb photodiode applications. Phys. Status Solidi (c). 2008. 5, № 2. P. 580 - 582.
https://doi.org/10.1002/pssc.200776821
58. Lebedev M.V., Sherstnev V.V., Kunicyna E.V. i dr. Passivaciya fotodiodov dlya infrakrasnoj oblasti spektra spirtovym sulfidnym rastvorom. FTP. 2011. 45, № 4. S. 535 - 539. (in Russian)
https://doi.org/10.1134/S1063782611040142
59. Lvova T.V., Dunaevskij M.S., Lebedev M.V. i dr. Himicheskaya passivaciya podlozhek InSb (100) v vodnyh rastvorah sulfida natriya. FTP. 2013. 47, № 5. S. 710 - 716. (in Russian)
https://doi.org/10.1134/S106378261305014X
60. Breitenstein O. Understanding Shunting Mechanisms in Silicon Cells: A Review. Proc. 17th NREAL workshop on crystalline silicon solar cells and modules: materials and processes. 2007. P.61-70.
61. Breitenstein O., Bauer J, Rakotonia J. P. Material-induced shunts in multicrystalline silicon solar cells. FTP. 2007. 41, №4. S.454-457.
https://doi.org/10.1134/S106378260704015X
62. Dongaonkar S, Servaites J. D., Ford G.M. et al. Universality of non-Ohmic shunt leakage in thin-film solar cells. J. Appl. Phys. 2010. 108, 124509.
https://doi.org/10.1063/1.3518509
63. Breitenstein O., Altermatt P., Ramspeck K., Green M. A., Zhao J., Schenk A.. Interpretation of the commonly observed IV characteristics of c-Si cells having ideality factor larger than two. IEEE 4th World Conference on Photovoltaic Energy Conference 1. 2006. P.879-884.
https://doi.org/10.1109/WCPEC.2006.279597
64. Tobin S.P., Iwasa S., Tredwell T.J. 1/f Noise in (Hg, Cd)Te Photodiodes. IEEE Trans. Electron. Dev. 1980. ED-27, N1. P.43-48.
https://doi.org/10.1109/T-ED.1980.19817
65. Vishnu Gopal, Sudha Gupta. Temperature dependence of ohmic shunt resistance in mercury cadmium telluride junction diode. Infrared Physics & Technology. 2004. 45. P. 265-271.
https://doi.org/10.1016/j.infrared.2003.11.008
66. Johnson S.M., Rhiger D. R., Rosbeck J. P., Peterson J. M., Taylor S. M. et al. Effect of dislocations on the electrical and optical properties of long wavelength infrared HgCdTe photovoltaic detectors. J. Vac. Sci. Technol. 1992. B10. P.1499-1503.
https://doi.org/10.1116/1.586278
67. Vishnu Gopal and Sudha Gupta. Modelling of the electrical effect of Dislocations in HgCdTe Infrared Photodiodes. Proc. 13th IWPSD. 2005. 2, P 1013-1021. Published by Allied Publishers Ltd., New Delhi, India. Eds. Vikram Kumar, S. K. Agarwal and S. N. Singh.
68. Shabel'nikova Ya. L., Yakimov E.B. Comparison between the EBIC and XBIC contrasts of dislocations and grain boundaries. J. Surf. Investigation. X-ray, Synchrotron and Neutron Techn. 2012. 6, N6. P.894-896.
https://doi.org/10.1134/S1027451012110109
69. Domaradzki J. Light Beam Induced Current (LBIC) technique for semiconductors and ICs Testing. Proc. SPIE. 2002. 5064. P.269-274.
70. Ballif C., Peters S., Isenberg J., Riepe S., Borchert D.. Shunt Imaging in Solar Cells Using Low Cost Commercial Liquid Crystal Sheets. Proc. 29th IEEE PVSC. 2002. P. 446-449.
71. Breitenstein O., Rakotoniaina J. P. Comparison of Shunt Imaging by Liquid Crystal Sheets and Lock-in Thermography. Proc. 12th Workshop on Crystalline Solar Cell Materials and Processes. 2002. P. 244-247.
72. Breitensteina O., Straube H., Iwig K. Lock-in thermography with depth resolution on silicon solar cells. Solar Energy Materials and Solar Cells. 2018. 185. P.66-74.
https://doi.org/10.1016/j.solmat.2018.05.009
73. Indium Antimonide Detectors. www.judsontechnologies.com.
74. Ando T., Fauler A., Stern F. Elektronnye svojstva dvumernyh sistem. M.: Mir, 1985. 416 s. (in Russian)
75. Balagurov L. A., Borkovskaya O.Yu., Dmitruk N.L. i dr. Poverhnostnyj potencial i poverhnostnye sostoyaniya v monokristallah InAs. FTP. 1976. 10, №6. S. 1108 - 1114. (in Russian)
76. Esina N.P., Zotova N.V., Karandashev S.A. i dr. Struktura metall - poluprovodnik na osnove p- InAs. FTP. 1983. 17, №6. S. 991 - 995. (in Russian)
77. Kalamejcev A.V., Romanov D. A., Kovchavcev A. P. i dr. Priroda otricatelnogo differencialnogo soprotivleniya neidealnogo barera Shottki na osnove arsenida indiya. FTP. 1997. 31, №3. S. 370 - 376. (in Russian)
78. Y. Kucherov Y., Hagelstein P., Sevastyanenko V., Brown H. L.. Study of emitter structures for InSb thermal diodes. 22nd Int. Conf. Thermoelectrics. 2002. P.578-581.
79. Hagelstein P. L., Kucherov Y. Enhanced figure of merit in thermal to electrical energy conversion using diode structures. Appl. Phys. Let. 2002. 81, N3. P. 559-561.
https://doi.org/10.1063/1.1493224
80. Sukach A. V., Olejnik G. S., Teterkin V. V. i dr. Issledovanie mehanizmov perenosa zaryada v diffuzionnyh InAs p-n- perehodah. OPT. Kiev: Nauk. dumka, 2005. - Vyp. 40. - S. 248 - 257. (in Russian)
81. Sukach A.V., Teterkin V.V. Transformaciya elektricheskih svojstv InAs p-n- perehodov v rezultate ultrazvukovoj obrabotki. Pisma ZhTF. 2009. 35, №11. S. 67 - 75. (in Russian)
82. Fridel Zh. Dislokacii. M.: Mir, 1967. 643 s. (in Russian)
83. Granato A., Lyukke K. Strunnaya model dislokacii i dislokacionnoe pogloshenie zvuka. V kn.: Fizicheskaya akustika. Pod red. U Mezena. M.: Mir. 1969. t.4, ch. A. S. 261-321. (in Russian)
84. Ostrovskij I.V. Akustolyuminescenciya i defekty kristallov. K.: Visha shkola. 1993. 223 s. (in Russian)
85. Skupov V.D., Tetelbaum D.I. O vliyanii uprugih napryazhenij na transformaciyu defektov v poluprovodnikah. FTP. 1987. 21,№8. S. 1495-1497. (in Russian)
86. Lampert M. A., Mark P.. Current Injection in Solids. Academic Press, New York. 1970.
87. Kao K. C., Hwang W. Electrical Transport in Solids With Particular Reference to Organic Semiconductors. Pergamon Press, Oxford. 1981.
88. Fotopriemniki vidimogo i IK diapazonov. Pod red. R.Dzh. Kies. M.: Radio i svyaz, 1985. 328 s. (in Russian)