Address of the Editor-in-Chief of the collection of scientific works "Optoelectronics and Semiconductor Technique" to the readers
Optoelektron. napìvprovìd. teh. 57, 5-6 (2022)
N.V. Kachur, H.V. Dorozinska, G.V. Dorozinsky, V.P. Maslov, A.V. Fedorenko
Prospects And Trends In The Development Of Devices And Methods Based On The Phenomenon Of Surface Plasmon Resonance In The Infrared Range (review)
Optoelektron. napìvprovìd. teh. 57, 7-17 (2022)
H.V. Dorozinska, V.P. Maslov, G.V. Dorozinsky
Application Of Plasmonics For The Analysis Of Polydisperse Systems (review)
Optoelektron. napìvprovìd. teh. 57, 18-28 (2022)
V.V. Tetyorkin, A.I. Tkachuk, A.T. Voroschenko, I.G. Lutsyshyn
Insb Photodiodes (review. Part V)
Optoelektron. napìvprovìd. teh. 57, 29-42 (2022)
O.I. Vlasenko, Z.K. Vlasenko
Induced Restructuring Of The Crystal Structure And Acoustic Response In Semiconductors Based On Cadmium Telluride For Use In Optoelectronics And Topical Areas Of Semiconductor Technology (review)
Optoelektron. napìvprovìd. teh. 57, 43-70 (2022)
B.G. Shabashkevich, Y.G. Dobrovolskyi, V.G.Yuryev, P.I. Neezhmakov, V.M. Sorokin, D.V. Pekur
Specialized Photometer For Monitoring The Brightness And Illumination Of The Road Surface
Optoelektron. napìvprovìd. teh. 57, 71-81 (2022)
S.O. Kostyukevych, K.V. Kostyukevych, R.V. Khrystosenko, A.A. Koptyukh, V.I. Pogoda.
Sensing Element Of The Surface Plasmon Sensor With Thermal Modification Of The Structural Properties Of The Polymer Substrate
Optoelektron. napìvprovìd. teh. 57, 82-92 (2022)
Ya.M. Olikh, M.D. Tymochko
Peculiarities Of Ultrasound Effect On 2deg And 3deg Charge Carriers Electronic Transport In Gan/Algan/Gan/Aln Heterostructures
Optoelektron. napìvprovìd. teh. 57, 93-100 (2022)
L.A. Nazarenko, K.I. Suvorova, M.V. Guryev
Spectral Power Distribution Of Leds And Pouch Photometry
Optoelektron. napìvprovìd. teh. 57, 101-113 (2022)
L.V. Shekhovtsov
Transition Layer And Lateral Photo-Emf In Semiconductor Heterosystems
Optoelektron. napìvprovìd. teh. 57, 114-120 (2022)
O.D. Kupko, A.I. Shloma
Analysis Of The Sources Of Uncertainty On The Way To Creating A Luminance Unit Standard
Optoelektron. napìvprovìd. teh. 57, 121-132 (2022)
A.A. Kryuchуn, V.V.Petrov, V.M. Rubish, M.L. Trunov, S.O. Kostyukevych, K.V. Kostyukevych
Technologies For Creating Surface Reliefs On Films Of Chalcogenide Semiconductors
Optoelektron. napìvprovìd. teh. 57, 133-144 (2022)
I.V. Pekur, D.V. Pekur
Spectral Parameters Of Quasi-Monochromatic Leds For Lighting Systems With Tunable Spectral Composition
Optoelektron. napìvprovìd. teh. 57,145-151 (2022)
H.V. Dorozinska, M. O. Hryhorchuk, G.V. Dorozinsky
Determination Of The Thickness Of Plasmon Carrier Layers By The Photometric Method
Optoelektron. napìvprovìd. teh. 57, 152-159 (2022)