https://doi.org/10.15407/iopt.2022.57.071

Optoelectron. Semicond. Tech. 57, 71-81 (2022)

B. G. Shabashkevich, Y. G. Dobrovolskyi, V. G.Yuryev, P. I. Neezhmakov, V. M. Sorokin, D. V. Pekur

SPECIALIZED PHOTOMETER FOR MONITORING THE BRIGHTNESS AND ILLUMINATION OF THE ROAD SURFACE

A specialized optical system for the Ekotensor-03 photometer was developed and based on it, the concept of direct measurements of the distribution of the brightness of the road surface, created, among other things, by LED light sources, was built. The specialized photometer (brightness meter), with readings directly in brightness units, was created on the basis of the Ekotensor-03 photometer of Ukrainian production, equipped with the appropriate optical system and mechanical devices. At the same time, instead of measuring brightness at a distance of 160 m at an angle of the receiver's field of view of 2 arc minutes vertically and 20 horizontally, it is suggested to bring the photometer closer to the illuminated planes, the brightness of which is determined, at a distance that eliminates the contradiction associated with the requirements of the DSTU and the problem of a small signal level generated by the photometric head at a long distance from the measurement object is removed. Taking into account the ultra-low levels of brightness during measurement in accordance with the requirements of the current DSTU and DBN, which is an obstacle even when carrying out measurements in controlled laboratory conditions of leading research centers, the proposed method has all the necessary advantages (high measurement accuracy, ease of implementation in non-laboratory (real) conditions, adaptability of the measurement model to the requirements of regulatory documents). The brightness measurement range of the photometer with a specialized optical system is from 0.1 Kd/m2 to 105 Kd/m2. The limits of the permissible main relative error of brightness measurement created by an arbitrary source do not exceed ± 5%. The uncertainty of calibration is 1.5%. The metrological support of the device is implemented with traceability to the national standards of the NSC "Institute of Metrology", in particular, to the primary standard of the unit of light power.

Keywords: InSb photodiode, cadmium diffusion, p-n junction, InSb substrates, passivation, sulfidation, shunt current.